Altana Micro-Wave-Scan Manual Manual do Utilizador Página 41

  • Descarregar
  • Adicionar aos meus manuais
  • Imprimir
  • Página
    / 62
  • Índice
  • MARCADORES
  • Avaliado. / 5. Com base em avaliações de clientes
Vista de página 40
40
AdvancedConguration
10.AdvancedConguration
10.1 Correction
Defects on the sample surface, such as scratches
or craters, can cause major errors in measurement
values. When Correction is activated, the affected
scan areas are cut out and the measurement
values are calculated from the sanitized data.
Pressing“operate”turnsCorrectiononandoff.
10.2 Plausibility Control
An option for comparing the corrected and
uncorrected measurement value. The greater the
difference between the corrected and uncorrected
data,themorecriticalisthesurfacedefect.Ifthe
difference is greater than 20 %, the measurement
will be evaluated as a faulty measurement. An
error message appears and a new measurement is
then needed.
Pressing“operate”turnsPlausibilityControlonand
off.
Vista de página 40
1 2 ... 36 37 38 39 40 41 42 43 44 45 46 ... 61 62

Comentários a estes Manuais

Sem comentários